{"title":"A Method To Improve EMI Shielding Predictions","authors":"C. Brench","doi":"10.1109/ISEMC.1992.626085","DOIUrl":null,"url":null,"abstract":"Colin E. Brench Digital Equipment Corporation 146 Main Street, Maynard, MA 01754 Overall perfonnance of a shield with one or more apertures depends upon a number of factors, including, the type and location of the source, the presence of adjacent conductors and the geometry of the shield. Both analytic and numerical techniques were employed in this work to analyze four separate indicators to shielding perfonnance. The four indicators used were shielding effectiveness, electric field suppression, magnetic field suppression and surface impedance.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"232-235"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626085","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Colin E. Brench Digital Equipment Corporation 146 Main Street, Maynard, MA 01754 Overall perfonnance of a shield with one or more apertures depends upon a number of factors, including, the type and location of the source, the presence of adjacent conductors and the geometry of the shield. Both analytic and numerical techniques were employed in this work to analyze four separate indicators to shielding perfonnance. The four indicators used were shielding effectiveness, electric field suppression, magnetic field suppression and surface impedance.
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一种改进电磁干扰屏蔽预测的方法
具有一个或多个孔的屏蔽的整体性能取决于许多因素,包括源的类型和位置,相邻导体的存在以及屏蔽的几何形状。本文采用解析和数值方法对屏蔽性能的四个独立指标进行了分析。使用的四个指标是屏蔽效能、电场抑制、磁场抑制和表面阻抗。
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