Handling of Multiple‐Wave Effects in the Measurement of Forbidden X‐Ray Reflections in TeO2

Abstract

Multiple‐wave X‐ray reflections usually aggravate the measurement of Bragg reflections, especially of weak “forbidden” reflections. Accurate analysis of multiple‐wave peaks usually allows to avoid this. However, multiple‐wave reflections can also provide information about crystal structure, since crystal cell parameters determine the positions of multi‐wave peaks. The forbidden reflections 002 and 100 in paratellurite are measured and an approach based on semi‐kinematical X‐ray scattering used to handle the multiple‐wave interferences is shown here.