Understanding the Temperature Profile of the IEC TS 62332-1 Dual-temperature Ageing Cell

Berihu Mebrahtom, S. Matharage, Qiang Liu, C. Krause, A. Gyore, L. van der Zel
{"title":"Understanding the Temperature Profile of the IEC TS 62332-1 Dual-temperature Ageing Cell","authors":"Berihu Mebrahtom, S. Matharage, Qiang Liu, C. Krause, A. Gyore, L. van der Zel","doi":"10.1109/CEIDP50766.2021.9705332","DOIUrl":null,"url":null,"abstract":"This paper discusses the challenges faced during the development of a dual-temperature test cell based on IEC technical specification TS 62332-1 to evaluate the ageing performance of transformer insulation systems. A dual-temperature test cell was built based on IEC TS 62332-1 and the performance of the test cell was investigated accordingly. Apart from measuring the conductor and the top liquid temperatures, additional temperature measurements were conducted in other locations including hot solid insulation, cold solid insulation, liquid immersion heaters and test cell surface. Temperature distribution inside the dual-temperature test cell is then analyzed. The results indicate the importance of location of top liquid temperature thermocouples and its effect on the overall temperature distribution. Some additional aspects for maintaining consistency between different test cells are also discussed.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"17 1","pages":"93-96"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP50766.2021.9705332","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper discusses the challenges faced during the development of a dual-temperature test cell based on IEC technical specification TS 62332-1 to evaluate the ageing performance of transformer insulation systems. A dual-temperature test cell was built based on IEC TS 62332-1 and the performance of the test cell was investigated accordingly. Apart from measuring the conductor and the top liquid temperatures, additional temperature measurements were conducted in other locations including hot solid insulation, cold solid insulation, liquid immersion heaters and test cell surface. Temperature distribution inside the dual-temperature test cell is then analyzed. The results indicate the importance of location of top liquid temperature thermocouples and its effect on the overall temperature distribution. Some additional aspects for maintaining consistency between different test cells are also discussed.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
了解IEC TS 62332-1双温老化电池的温度分布
本文讨论了基于IEC技术规范TS 62332-1的变压器绝缘老化性能双温测试单元开发过程中面临的挑战。建立了基于IEC TS 62332-1标准的双温度测试单元,并对其性能进行了研究。除了测量导体和顶部液体温度外,还在其他位置进行了额外的温度测量,包括热固体绝缘,冷固体绝缘,液体浸入加热器和测试电池表面。然后分析了双温试验槽内的温度分布。研究结果表明,热电偶顶部温度位置的重要性及其对整体温度分布的影响。还讨论了维护不同测试单元之间一致性的一些附加方面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Application of Principal Component Analysis for the Monitoring of the Aging Process of Nuclear Electrical Cable Insulation Simulation of Partial Discharge Electromagnetic Wave Propagation in a Switchgear Compartment Comparative Analysis of Dielectric Insulating Ropes for Live Working DC Electrical Trees in XLPE Induced by Short Circuits A Non-destructive Condition Assessment Method for DBC Substrate: Dielectric Measurement
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1