Self-contained built-in-self-test/repair transceivers for interconnects in 3DICs

M. Aung, T. T. Kim
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Abstract

In this paper, we propose self-contained built-in-self-test/repair (BIST/R) solutions to improve the reliability of the direct face-to-face copper thermo-compression bonding A dual-mode transceiver is presented to operate either as an ohmic mode when the bonding has low resistance or as a capacitive coupling mode when the bonding is faulty showing high resistance.
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用于3dic互连的独立内置自检/修复收发器
在本文中,我们提出了自包含的内置自检/修复(BIST/R)解决方案,以提高直接面向铜热压缩键合的可靠性。提出了双模收发器,当键合具有低电阻时作为欧姆模式工作,当键合故障时作为电容耦合模式工作,显示高电阻。
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