CMOS integrated system for Terahertz Detection

R. Giusto, F. Centurelli, F. Palma
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Abstract

We present the study of a new structure for integrated rectifier, realized with standard CMOS technology, suitable to detect the terahertz radiation, at room temperature. The structure consists of a capacitive rectenna, designed as a patch antenna realized with the last metal layer of the CMOS process. A whisker reaches the gate of a MOS-FET transistor from the antenna, obtained with a standard via. Rectification can be obtained by the self-mixing effect occurring into the plasma waves generate in the substrate, underneath the gate. The proposed solution can be integrated with existing imaging systems, since it does not requires scaling toward very narrow and costly technological node.
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太赫兹检测CMOS集成系统
本文研究了一种新的集成整流器结构,该结构采用标准CMOS技术实现,适用于室温下的太赫兹辐射检测。该结构由电容整流天线组成,设计为贴片天线,采用CMOS工艺的最后一层金属层实现。晶须从天线到达MOS-FET晶体管的栅极,通过标准通孔获得。整流可以通过发生在栅极下面衬底中产生的等离子体波中的自混合效应来获得。该解决方案可以与现有的成像系统集成,因为它不需要扩展到非常狭窄和昂贵的技术节点。
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