Thick Film Laser Sintering: An Evidence for Two-step Process

E. Antonelli, M. Andreeta, E. Botero, A. Hernandes
{"title":"Thick Film Laser Sintering: An Evidence for Two-step Process","authors":"E. Antonelli, M. Andreeta, E. Botero, A. Hernandes","doi":"10.2174/1874846501306010001","DOIUrl":null,"url":null,"abstract":"The results for the sintering of Bi4Ti3O12 (BIT)-doped BaTi0.85Zr0.15O3 (BTZ) thick films, deposited by electro- phoresis, using as heating source a CO2 laser are presented. The thermal process associated to the laser scanning sintering (LSS) acted in a similar way as a two-step-sintering process. This characteristic together with the high heating rate al- lowed us to obtain thick films with an average grain size of 200 nm, high relative density (~96%) and with a homogene- ous microstructure. The X ray diffraction profile analysis show evidences for Bi 3+ replacing Ba 2+ at the A sites.","PeriodicalId":23072,"journal":{"name":"The Open Crystallography Journal","volume":"1 1","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2013-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Open Crystallography Journal","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2174/1874846501306010001","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The results for the sintering of Bi4Ti3O12 (BIT)-doped BaTi0.85Zr0.15O3 (BTZ) thick films, deposited by electro- phoresis, using as heating source a CO2 laser are presented. The thermal process associated to the laser scanning sintering (LSS) acted in a similar way as a two-step-sintering process. This characteristic together with the high heating rate al- lowed us to obtain thick films with an average grain size of 200 nm, high relative density (~96%) and with a homogene- ous microstructure. The X ray diffraction profile analysis show evidences for Bi 3+ replacing Ba 2+ at the A sites.
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厚膜激光烧结:两步工艺的证据
本文介绍了以CO2激光器为热源,电沉积Bi4Ti3O12 (BIT)掺杂BaTi0.85Zr0.15O3 (BTZ)厚膜的结果。与激光扫描烧结(LSS)相关的热过程与两步烧结过程类似。这种特性加上高加热速率使我们获得了平均晶粒尺寸为200 nm的厚膜,相对密度高(~96%),并且具有均匀的微观结构。X射线衍射分析表明,b3 +取代了Ba 2+。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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