Effect of content on microstructure of PI/TiO2 hybrid Films

Abstract

A small-angle x-ray scattering (SAXS) technique using synchrotron radiation as the x-ray source has been employed to characterize the microstructure of PI/TiO2 hybrid films prepared by Sol-Gel method. It is shown that the SAXS profile is hardly constant with Porod's law showing a negative and positive slope, suggesting that an interfacial layer exists between the nanoparticles and PI matrix in films when content of more than 5%. This suggests that the inorganic nanoparticles linked to the PI matrix through covalent bond. However, the only positive deviation exists in the film of content 5%. The reason is that there is a fluctuation of electron density in hybrid system. This kind of material has also been proved to possess both surface and mass fractal structures.