Study of optical, structural and electrical properties of copper oxide films prepared by chemical bath deposition with laser at different concentrations

Mohammed A. Jabr, Abdullah M. Ali, Raid A. Ismail
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Abstract

In this study, a copper oxide (CuO) thin film was prepared by the (Continuous-Wave) CW laser assisted-chemical bath deposition (LACBD) technique. The effect of laser wavelength on the structural, optical, and electrical properties of CuO film was investigated. The X-ray diffraction (XRD) study shows that the deposited CuO films are crystalline with a monoclinic structure. The optical energy gap increases with the use of a laser during film preparation and it varies from 2.3 to 1.8 eV. The scanning electron microscope (SEM) images confirm that the morphology of the film was dependent on the laser wavelength. Increasing the laser wavelength results in decreasing the grain size of the film which enhancing the crystallization. Energy dispersive X-ray (EDX) analysis confirms the presence of copper and oxygen elements.  Hall measurement revealed that the deposited films are p-type and the electrical conductivity and mobility increased with the use of a laser. The current-voltage characteristics of the p-CuO/p-Si heterojunction were studied in the dark and under illumination. The maximum optical current of the prepared photodetector at a laser wavelength of 550 nm was found to be in the order of 1.59 × 1012 cm.Hz1/2.W-1. The spectral responsivity revealed that the photodetectors exhibit two peaks of response at 450 nm and 800 nm. The maximum responsivity reached was 0.48 A/W at 450 nm and 0.53 A/W at 800 nm for a photodetector prepared at the laser wavelength of 550 nm.
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不同浓度激光化学浴沉积氧化铜薄膜的光学、结构和电学性能研究
本研究采用连续波激光辅助化学浴沉积(LACBD)技术制备了氧化铜(CuO)薄膜。研究了激光波长对CuO薄膜结构、光学和电学性能的影响。x射线衍射(XRD)研究表明,沉积的CuO薄膜呈单斜晶状。在薄膜制备过程中,随着激光的使用,光能隙增大,在2.3 ~ 1.8 eV之间变化。扫描电镜(SEM)图像证实了薄膜的形貌与激光波长有关。增加激光波长可减小薄膜的晶粒尺寸,从而增强薄膜的结晶性。能量色散x射线(EDX)分析证实了铜和氧元素的存在。霍尔测量结果表明,沉积膜为p型,且电导率和迁移率随激光的使用而增加。研究了p-CuO/p-Si异质结在黑暗和光照条件下的电流-电压特性。所制备的光电探测器在550 nm激光波长处的最大光电流为1.59 × 1012 cm.Hz1/2.W-1。光谱响应率表明,光电探测器在450 nm和800 nm处有两个响应峰。波长为550 nm的光电探测器在450 nm和800 nm处的最大响应度分别为0.48 A/W和0.53 A/W。
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