Partial discharges in electrical trees grown at 0.1 (VLF) and 50 Hz analyzed using PRPD and NLTSA

Pablo Donoso, R. Schurch, J. Ardila-Rey
{"title":"Partial discharges in electrical trees grown at 0.1 (VLF) and 50 Hz analyzed using PRPD and NLTSA","authors":"Pablo Donoso, R. Schurch, J. Ardila-Rey","doi":"10.1109/CEIDP50766.2021.9705339","DOIUrl":null,"url":null,"abstract":"Electrical treeing is one of the main degradation mechanisms in high voltage polymeric insulation that could lead to electrical equipment failure. Electrical trees grow under partial discharge (PD) activity; therefore, PD measurement is a fundamental tool for electrical insulation diagnosis. In this paper, PDs are analyzed for electrical trees grown in epoxy resin needle-plane samples at very low frequency (VLF) 0.1 Hz and 50 Hz excitation voltages. PD analysis was carried out through the traditional PRPD analysis and with nonlinear time series analysis (NLTSA) tools, which is more recent in this context. For PRPD analysis at VLF, the discharge power and the 95th percentile of PD amplitude showed a nearly linear increase with the tree length. However, at 50 Hz, these parameters showed an oscillatory behavior which could be a consequence of a more conductive structure. For NLTSA, we calculated the correlation dimension and Lyapunov exponent. This last parameter showed positive values for VLF and 50 Hz tests, indicating a deterministic chaotic behavior for both cases.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"2 1","pages":"200-203"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP50766.2021.9705339","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Electrical treeing is one of the main degradation mechanisms in high voltage polymeric insulation that could lead to electrical equipment failure. Electrical trees grow under partial discharge (PD) activity; therefore, PD measurement is a fundamental tool for electrical insulation diagnosis. In this paper, PDs are analyzed for electrical trees grown in epoxy resin needle-plane samples at very low frequency (VLF) 0.1 Hz and 50 Hz excitation voltages. PD analysis was carried out through the traditional PRPD analysis and with nonlinear time series analysis (NLTSA) tools, which is more recent in this context. For PRPD analysis at VLF, the discharge power and the 95th percentile of PD amplitude showed a nearly linear increase with the tree length. However, at 50 Hz, these parameters showed an oscillatory behavior which could be a consequence of a more conductive structure. For NLTSA, we calculated the correlation dimension and Lyapunov exponent. This last parameter showed positive values for VLF and 50 Hz tests, indicating a deterministic chaotic behavior for both cases.
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使用PRPD和NLTSA分析0.1 (VLF)和50 Hz生长的电树的部分放电
电气树是高压聚合物绝缘的主要退化机制之一,可导致电气设备故障。电树生长在局部放电(PD)活动下;因此,局部放电测量是电气绝缘诊断的基本工具。本文分析了生长在环氧树脂针状面样品中的电树在极低频(VLF) 0.1 Hz和50 Hz激励电压下的PDs。PD分析是通过传统的PRPD分析和非线性时间序列分析(NLTSA)工具进行的,NLTSA是在这种背景下较新的工具。对于VLF下的PRPD分析,放电功率和第95百分位PD振幅随树长呈近线性增长。然而,在50 Hz时,这些参数显示出振荡行为,这可能是更导电结构的结果。对于NLTSA,我们计算了相关维数和Lyapunov指数。最后一个参数在VLF和50 Hz测试中显示正值,表明两种情况下都存在确定性混沌行为。
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