R. McPartland, D. Loeper, F. Higgins, Raj Singh, G. MacDonald, G. Komoriya, S. Aymeloglu, M. DePaolis, C. Leung
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引用次数: 13
Abstract
This paper describes the use of low cost, flash EEPROM switches to control redundancy in SRAM embedded memories. Flash cell design, operation and process technology are described. A 768K-bit embedded SRAM memory with flash controlled column redundancy and built in self-repair is presented.
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