R. P. Bastos, F. Sill, J. Dutertre, M. Flottes, G. D. Natale, B. Rouzeyre
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引用次数: 20
Abstract
This work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks of the monitored logic. The proposed protection strategy is also useful for improving any state-of-the-art Bulk-BICS from pairs of PMOS and NMOS sensors to single sensors.
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