Tailoring superconducting phases observed in hyperdoped Si:Ga for cryogenic circuit applications

K. Sardashti, T. Nguyen, M. Hatefipour, W. Sarney, J. Yuan, W. Mayer, K. Kisslinger, J. Shabani
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引用次数: 4

Abstract

Hyperdoping with gallium (Ga) has been established as a route to observe superconductivity in silicon (Si). The relatively large critical temperatures (T$_{\rm c}$) and magnetic fields (B$_{\rm c}$) make this phase attractive for cryogenic circuit applications, particularly for scalable hybrid superconductor--semiconductor platforms. However, the robustness of Si:Ga superconductivity at millikelvin temperatures is yet to be evaluated. Here, we report the presence of a reentrant resistive transition below T$_{\rm c}$ for Si:Ga whose strength strongly depends on the distribution of the Ga clusters that precipitate in the implanted Si after annealing. By monitoring the reentrant resistance over a wide parameter space of implantation energies and fluences, we determine conditions that significantly improve the coherent coupling of Ga clusters, therefore, eliminating the reentrant transition even at temperatures as low as 20~mK.
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低温电路中超掺Si:Ga中超导相的剪裁
镓(Ga)的超掺杂已被确立为观察硅(Si)超导性的途径。相对较大的临界温度(T$_{\rm c}$)和磁场(B$_{\rm c}$)使该相对于低温电路应用具有吸引力,特别是对于可扩展的混合超导体-半导体平台。然而,Si:Ga超导性在毫开尔文温度下的稳健性还有待评估。在这里,我们报道了Si:Ga在T$_{\rm c}$以下的可重入电阻跃迁的存在,其强度很大程度上取决于退火后在注入Si中沉淀的Ga团簇的分布。通过监测注入能量和影响的宽参数空间内的重入阻力,我们确定了显著改善Ga簇相干耦合的条件,因此,即使在低至20~mK的温度下也可以消除重入跃迁。
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