Reliability Analysis of Pre-insertion Resistors for EHV/UHV SF6 Circuit Breakers

Bo Niu, Yuhua Xu, Feiyue Ma, Xiu Zhou, Lei Chen, Yin Wei
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引用次数: 1

Abstract

Pre-insertion resistors (PIR) is used to suppress the inrush current and transient over voltages in the closing of circuit breaker, and its special application results in a high failure rate. This paper first takes 750 kV AC filter banks circuit breaker PIR as a model, and three typical defects of PIR are simulated by COMSOL. Then, according to the simulation results, the defect analysis methods of dynamic resistance fitting method, and PIR current impulse, PIR voltage impulse are presented. Finally, the combined circuit breaker control strategy which combining the series of PIR circuit breaker with the phase-selecting closing device is proposed, and the optimal combination strategy is given through PSCAD.
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超高压/特高压SF6断路器预插电阻可靠性分析
预插入电阻(PIR)用于抑制断路器合闸时的涌流和瞬态过电压,其特殊的应用导致了断路器的高故障率。本文首先以750kv交流滤波组断路器PIR为模型,利用COMSOL软件对PIR的三种典型缺陷进行了仿真。然后,根据仿真结果,提出了动态电阻拟合法和PIR电流冲击、PIR电压冲击的缺陷分析方法。最后,提出了串联PIR断路器与选相合闸装置相结合的组合断路器控制策略,并通过PSCAD给出了最优组合策略。
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