FPGA routing architecture analysis under variations

S. Srinivasan, P. Mangalagiri, Yuan Xie, N. Vijaykrishnan
{"title":"FPGA routing architecture analysis under variations","authors":"S. Srinivasan, P. Mangalagiri, Yuan Xie, N. Vijaykrishnan","doi":"10.1109/ICCD.2007.4601894","DOIUrl":null,"url":null,"abstract":"Systems with the combined features of ASICs and field programmable gate arrays(FPGAs) are increasingly being considered as technology forerunners looking at their extraordinary benefits. This drags FPGAs into the technology scaling race along with ASICs exposing the FPGA industries to the problems associated with scaling. Extensive process variations is one such issue which directly impacts the profit margins of hardware design beyond 65 nm gate length technology. Since the resources in FPGAs are primarily dominated by the interconnect fabric, variations in the interconnect impacting the critical path timing and leakage yield needs rigorous analysis. In this work we provide a statistical modeling of individual routing components in an FPGA followed by a statistical methodology to analyze the timing and leakage distribution. This statistical model is incorporated into the routing algorithm to model a new statistically intelligent routing algorithm (SIRA), which simultaneously optimizes the leakage and timing yield of the FPGA device. We demonstrate and average leakage yield increase of 9% and timing yield by 11% using our final algorithm.","PeriodicalId":6306,"journal":{"name":"2007 25th International Conference on Computer Design","volume":"100 1","pages":"152-157"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 25th International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2007.4601894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Systems with the combined features of ASICs and field programmable gate arrays(FPGAs) are increasingly being considered as technology forerunners looking at their extraordinary benefits. This drags FPGAs into the technology scaling race along with ASICs exposing the FPGA industries to the problems associated with scaling. Extensive process variations is one such issue which directly impacts the profit margins of hardware design beyond 65 nm gate length technology. Since the resources in FPGAs are primarily dominated by the interconnect fabric, variations in the interconnect impacting the critical path timing and leakage yield needs rigorous analysis. In this work we provide a statistical modeling of individual routing components in an FPGA followed by a statistical methodology to analyze the timing and leakage distribution. This statistical model is incorporated into the routing algorithm to model a new statistically intelligent routing algorithm (SIRA), which simultaneously optimizes the leakage and timing yield of the FPGA device. We demonstrate and average leakage yield increase of 9% and timing yield by 11% using our final algorithm.
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FPGA路由结构变化分析
集成集成电路(asic)和现场可编程门阵列(fpga)相结合的系统越来越被认为是技术先驱,因为它们具有非凡的优势。这将FPGA与asic一起拖入了技术扩展竞赛,使FPGA行业暴露于与扩展相关的问题。广泛的工艺变化就是这样一个问题,它直接影响到65纳米栅极长度技术以外硬件设计的利润空间。由于fpga中的资源主要由互连结构控制,因此需要严格分析互连中影响关键路径时序和泄漏率的变化。在这项工作中,我们提供了FPGA中单个路由组件的统计建模,然后使用统计方法分析时序和泄漏分布。将该统计模型引入到路由算法中,建立了一种新的统计智能路由算法(SIRA),该算法同时优化了FPGA器件的漏率和时序良率。我们证明,使用我们的最终算法,泄漏率平均提高9%,时序率提高11%。
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