Failsafe wafer-level packaging of a piezoelectric MEMS actuator

M. Matin, K. Ozaki, D. Akai, K. Sawada, M. Ishida
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Abstract

Micro-electro-mechanical systems (MEMS) technology can offer a viable alternative to realize miniaturized and less expensive actuators for deformable mirror in adaptive optics for high resolution retinal imaging. However, during fabrication of such devices, functional multilayered thin films are generally deposited at elevated temperatures. These films are therefore subjected to residual stresses which may result in bending of the structure. The bending thus occurred may lead to failure at interfaces between films. A successful fabrication of device therefore relies on the engineering justification of multi-structured device design and growth parameters used in fabrication. In this paper, we present the design of a piezoelectric (ceramic) thin film based MEMS actuator for deformable mirror used in retinal imaging. A proto-type piezoelectric thin film actuator has been fabricated epitaxially using Pt/PZT/SRO/Pt/γ-Al2O3/Si structure. Advanced 3D finite element simulations were conducted to correlate the bending of fabricated structure with residual stresses. A smart alternative design was also proposed employing an extra layer of aluminium in the diaphragm region. Simulation results predict a failsafe structure when the thickness of extra Al-layer is tailored to an optimal thickness. The outcome of this research can be used to overcome the challenge encountered (bending due to residual stresses) to obtain a failsafe wafer-level packaged MEMS actuator for deformable mirror.
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压电MEMS致动器的故障安全晶圆级封装
微机电系统(MEMS)技术为实现高分辨率视网膜成像的自适应光学中可变形镜的小型化和低成本执行器提供了可行的替代方案。然而,在这种器件的制造过程中,功能多层薄膜通常是在高温下沉积的。因此,这些薄膜受到可能导致结构弯曲的残余应力的影响。这样发生的弯曲可能导致膜间界面的破坏。因此,器件的成功制造依赖于多结构器件设计和制造中使用的生长参数的工程论证。在本文中,我们提出了一种基于压电(陶瓷)薄膜的MEMS致动器的设计,用于视网膜成像的可变形镜。采用Pt/PZT/SRO/Pt/γ-Al2O3/Si外延结构制备了压电薄膜致动器原型。采用先进的三维有限元模拟方法,将预制结构的弯曲与残余应力联系起来。一个聪明的替代设计也提出了在隔膜区域采用额外的一层铝。仿真结果表明,当额外铝层厚度达到最佳厚度时,可以获得故障安全结构。本研究结果可用于克服所遇到的挑战(由于残余应力而弯曲),以获得用于变形镜的故障安全晶圆级封装MEMS驱动器。
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Parasitic electrical and electromagnetic effects Heat management Passive electronic components Interconnection technology Reliability and maintainability
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