New Insights on Technology and Assessment: Introduction to JWOP Special Issue

Abstract

In this Special Issue we have depicted an approach to technology and assessment counting on some scholars who have previously participated in the chair of the Psychometric Models & Applications Conference Series organized by the Universidad Autónoma de Madrid (UAM) with the wise chairing of Vicente Ponsoda and Julio Olea over the last two decades. The idea and initial works were initially proposed at the Third Spanish National Congress of Psychology held in Oviedo in 2017. The Psychometric Models & Applications chair is being conjointly sponsored by the UAM and the UAM’s Instituto de Ingeniería del Conocimiento [Institute of Knowledge Engineering]. Its main aim is to disseminate assessment and testing innovations among personnel selection practitioners and organizational psychologists. To achieve this goal, the Chair’s central activity is an annual seminar. We choose a central topic and asked a few well-known experts to participate in the selected topic every year. Some invited speakers of previous seminars accepted to submit a paper to this JWOP Special Issue as well. Their names and seminar topics they contributed are listed below: Faking in Personality Testing (Jesús Salgado), Psychometric Methods to Detect Faking (Vicente Ponsoda), Situational Judgment Testing (Filip Lievens), Future Directions in Selection Assessment (Ann Marie Ryan), Contributions of Meta-Analytical Techniques to the Advancement in Personnel Selection (Silvia Moscoso), Advances in Adaptive Measurement (Francisco José Abad), Personnel Selection through Social Media (David Aguado), and Personnel Recruitment through Web Resources (Antonio León García-Izquierdo). The goal of this Special Issue of Journal of Work and Organizational Psychology was to provide academics and professionals with some reflections and the state of the art in the technology and assessment field with the contribution of scholars who accepted the challenge of updating knowledge in this field.