Time and memory-aware runtime monitoring for executing model-based test cases in embedded systems

Abstract

The existing model-based tools employ runtime monitoring methodologies for debugging and testing of embedded systems. In these tools, the additional instrumentation for incorporating and executing the test code varies based on the application. Such techniques could also introduce significant, non-deterministic overhead in the embedded system. This is a hurdle in applying Model-Based Testing (MBT) for resource constrained embedded systems and industrially relevant examples. To address this gap, this paper elaborates on the monitoring methodology used in a test framework for executing the model-based test cases in the embedded system. Two variants of the proposed monitoring methodology, (a) software and (b) on-chip monitoring are discussed. An empirical evaluation based on a prototype implementation of the proposed runtime monitoring mechanisms is discussed.