{"title":"A Volume Current Based Method of Moments Analysis of Shielded Planar 3-D Circuits in Layered Media","authors":"J. Rautio, Matthew Thelen","doi":"10.1109/IMS30576.2020.9223892","DOIUrl":null,"url":null,"abstract":"Method of moments analysis of planar multi-layer circuits typically assumes conductors are infinitely thin and only surface currents need be modeled. Modern fabrication methods, especially for high frequency integrated circuits, can easily create structures that require modeling volume current. Combined with previous work, this paper presents, for the first time, a complete volume current based method of moments analysis of shielded multi-layer circuits. The new volume and the original surface subsections are all evaluated to full numerical precision by 2-D FFT and have little impact on analysis speed.","PeriodicalId":6784,"journal":{"name":"2020 IEEE/MTT-S International Microwave Symposium (IMS)","volume":"1978 1","pages":"146-149"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE/MTT-S International Microwave Symposium (IMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMS30576.2020.9223892","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Method of moments analysis of planar multi-layer circuits typically assumes conductors are infinitely thin and only surface currents need be modeled. Modern fabrication methods, especially for high frequency integrated circuits, can easily create structures that require modeling volume current. Combined with previous work, this paper presents, for the first time, a complete volume current based method of moments analysis of shielded multi-layer circuits. The new volume and the original surface subsections are all evaluated to full numerical precision by 2-D FFT and have little impact on analysis speed.
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