{"title":"Challenges of Nanotechnologies and some Reliability Aspects","authors":"Titu-Marius I. Băjenescu","doi":"10.46904/eea.23.71.1.1108007","DOIUrl":null,"url":null,"abstract":"The paper takes a fresh look at lessons learned from the last domain development. After a short introduction, the advent of 3D Technology, the device shrinking, carbon nanotubes, packaging and fabrication, critical dimensions, safety of environmental, health and safety (EHS), and the evaluation of reliability are presented.","PeriodicalId":38292,"journal":{"name":"EEA - Electrotehnica, Electronica, Automatica","volume":"5 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EEA - Electrotehnica, Electronica, Automatica","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.46904/eea.23.71.1.1108007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The paper takes a fresh look at lessons learned from the last domain development. After a short introduction, the advent of 3D Technology, the device shrinking, carbon nanotubes, packaging and fabrication, critical dimensions, safety of environmental, health and safety (EHS), and the evaluation of reliability are presented.
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