{"title":"A 4 GHz Near-Field Monitoring Planar Oscillator Sensor","authors":"M. Abdolrazzaghi, M. Daneshmand","doi":"10.1109/IMWS-AMP.2018.8457169","DOIUrl":null,"url":null,"abstract":"This work illustrates a negative resistance-based oscillator in microwave regime that is used as a non-contact sensing apparatus. The oscillator generates −0.28 dBm output power at 3.992 GHz that is used as a near-field monitoring device. A 4×6 mosaic pattern of dielectric slabs (2cm × 2cm each) is filled with various permittivity values ranging from 2.2 – 12.85. ±50 kHz resolution in recognizing the dielectric constant of the slabs in each row and column ensures a repeatable response when the sensor is 5mm away from the test surface.","PeriodicalId":6605,"journal":{"name":"2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"61 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMWS-AMP.2018.8457169","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
This work illustrates a negative resistance-based oscillator in microwave regime that is used as a non-contact sensing apparatus. The oscillator generates −0.28 dBm output power at 3.992 GHz that is used as a near-field monitoring device. A 4×6 mosaic pattern of dielectric slabs (2cm × 2cm each) is filled with various permittivity values ranging from 2.2 – 12.85. ±50 kHz resolution in recognizing the dielectric constant of the slabs in each row and column ensures a repeatable response when the sensor is 5mm away from the test surface.
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