Comparative Single Photon Time Resolution Measurements of Commercial Silicon-Photomultipliers and a Specially Designed SiPM with High Accuracy in 0.35 µm Technology
{"title":"Comparative Single Photon Time Resolution Measurements of Commercial Silicon-Photomultipliers and a Specially Designed SiPM with High Accuracy in 0.35 µm Technology","authors":"Jonathan Preitnacher, W. Hansch","doi":"10.11648/j.ijmsa.20231201.14","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":14116,"journal":{"name":"International Journal of Materials Science and Applications","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Materials Science and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11648/j.ijmsa.20231201.14","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}