Y. Koike, S. Tetsukawa, M. Nishitani, H. Kitahara, V. Mag-usara, M. Asakawa, M. Yoshimura, M. Tani, M. Nakajima
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Abstract
We demonstrate the feasibility of mapping metallic layer thickness profile in 2 dimension based on the amplitude of the terahertz emission of a large area spintronic heterostructure. A Fe/Pt bilayer was deposited on glass substrate such that a 100 mm diameter circular space was covered with 4 nm Pt throughout and with a gradient of 0.5 nm to 7 nm thick Fe by magnetron sputtering. The Fe thickness dependence of the spintronic THz emission is clearly observed in just one sample by two-dimensional amplitude mapping.
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