{"title":"The application of the Smoluchowski effect to explain the current-voltage characteristics of high-k MIM capacitors","authors":"W. Lau","doi":"10.1109/CSTIC.2017.7919803","DOIUrl":null,"url":null,"abstract":"In this paper, the Smoluchoski effect will be explained and is further used to understand the physics of the current-voltage (I–V) characteristics of high-k MIM capacitors in mixed-signal CMOS technology application.","PeriodicalId":6846,"journal":{"name":"2017 China Semiconductor Technology International Conference (CSTIC)","volume":"32 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC.2017.7919803","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
In this paper, the Smoluchoski effect will be explained and is further used to understand the physics of the current-voltage (I–V) characteristics of high-k MIM capacitors in mixed-signal CMOS technology application.
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