Susceptibility Of Charge-coupled Devices To RF And Microwave Radiation

Abstract

This paper describes the test methodology and the test results of Radio Frequency (RF) and microwave susceptibility measurements performed on charge-coupled devices (CCD's). Conducted susceptibility measurements were performed on a CCD image sensor chip and radiated susceptibility measurements were performed on a camera system which uses the same CCD chip as the image sensor. The measurement results indicate that imaging systems which employ CCD sensors are susceptible to modest electromagnetic (EM) environments. Thus, when operated in severe EM environments, CCD-based imaging systems will require significant hardening to operate without upset. The work described in this paper was sponsored by Rome Laboratory under Contract No. F30602-89-C-0165.