A 10b 50MS/s 820µW SAR ADC with on-chip digital calibration

M. Yoshioka, K. Ishikawa, T. Takayama, Sanroku Tsukamoto
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引用次数: 181

Abstract

Rapid growth in the demand for “Green-IT” or medical applications requires power efficient ADCs. SAR ADC power scales with CMOS technology because it does not need operational amplifiers, which are getting difficult to design in deeply scaled CMOS. Recent published SAR ADCs have no static current, which improves energy efficiency [1, 2]. Split capacitor digital-to-analog converter (CDAC) is one of the best architectures for high resolution SAR ADC, but is very sensitive to the splitting capacitor because of its fractional value and parasitic. Conventional SAR ADC needs approximately 10 times faster external clock if it has no internal clock generator. However the internal SAR clock generation enables the external clock frequency to be the same as the sampling rate, but suffers from unstable operation caused by large PVT delay variation. This ADC is designed with on-chip digital calibration techniques, comparator offset calibration, CDAC linearity error calibration and internal clock frequency control to compensate for the PVT variation. The ADC is integrated in 65nm CMOS and achieved 10b at 50MS/s while consuming 820µW from a 1.0V supply.
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10b 50MS/s 820µW SAR ADC,片上数字校准
“绿色it”或医疗应用需求的快速增长需要高能效adc。SAR ADC的功率采用CMOS技术进行缩放,因为它不需要运算放大器,而运算放大器在深度缩放的CMOS中设计变得越来越困难。最近发表的SAR adc没有静态电流,这提高了能源效率[1,2]。分路电容数模转换器(CDAC)是高分辨率SAR ADC的最佳架构之一,但由于分路电容的分数值和寄生特性,对分路电容非常敏感。如果没有内部时钟发生器,传统的SAR ADC需要大约10倍快的外部时钟。然而,内部SAR时钟生成使外部时钟频率与采样率相同,但由于PVT延迟变化较大,导致运行不稳定。该ADC采用片上数字校准技术、比较器偏置校准、CDAC线性误差校准和内部时钟频率控制来补偿PVT变化。该ADC集成在65nm CMOS中,在50MS/s下实现10b,而在1.0V电源下消耗820 μ W。
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