{"title":"A Method for Logic Circuit Test Generation Based on Boolean Partial Derivative and BDD","authors":"Changqian Wang, Chenghua Wang","doi":"10.1109/CSIE.2009.44","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":90690,"journal":{"name":"Proceedings of the ... WRI World Congress on Computer Science and Information Engineering. WRI World Congress on Computer Science and Information Engineering","volume":"78 1","pages":"499-504"},"PeriodicalIF":0.0000,"publicationDate":"2009-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ... WRI World Congress on Computer Science and Information Engineering. WRI World Congress on Computer Science and Information Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSIE.2009.44","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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