{"title":"Development of a High-Speed Multi-Target Measurement System-on-Chip","authors":"A. Rumyantsev, T. Krupkina, V. Losev","doi":"10.1109/EICONRUS.2019.8657298","DOIUrl":null,"url":null,"abstract":"The article is devoted to the creation of the high-speed multi-target measurement system-on-chip. The measurement system includes integral blocks and special soft. The program for interaction with integral blocks of the measurement system and the data analysis tools has been developed in LabVIEW environment. Two variants of users interface have been realized: for communication to the digital analyzer-generator NI-PXI-6548 and the universal asynchronous receiver-transmitter interface. The main purpose of the research is to create a measurement system, which makes the process of the measurement on the wafer cheaper and more productive.","PeriodicalId":6748,"journal":{"name":"2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)","volume":"33 1","pages":"1601-1604"},"PeriodicalIF":0.0000,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EICONRUS.2019.8657298","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The article is devoted to the creation of the high-speed multi-target measurement system-on-chip. The measurement system includes integral blocks and special soft. The program for interaction with integral blocks of the measurement system and the data analysis tools has been developed in LabVIEW environment. Two variants of users interface have been realized: for communication to the digital analyzer-generator NI-PXI-6548 and the universal asynchronous receiver-transmitter interface. The main purpose of the research is to create a measurement system, which makes the process of the measurement on the wafer cheaper and more productive.
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