Low slow-wave effect and crosstalk for low-cost ABF-coated TSVs in 3-D IC interposer

Yu-Jen Chang, Tai-Yu Zheng, Hao-Hsiang Chuang, Chuen-De Wang, P. Chen, T. Kuo, C. Zhan, Shih-Hsien Wu, W. Lo, Yi-Chang Lu, Y. Chiou, Tzong-Lin Wu
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引用次数: 10

Abstract

A solution for reducing the signal distortion in SiO2-coated through silicon vias (TSVs) is proposed. The mechanism can be explained by using a verified equivalent circuit model of a four-TSV system. Based on this circuit model, the phenomena that larger thickness of dielectric layer causes lower slow-wave factor (SWF), smaller insertion loss and smaller crosstalk level can be observed. With the aid of ajinomoto-build-up-film-coated (ABF-coated) TSVs, the solution can be implemented. The insertion loss is 3 dB better, the near-end crosstalk is 5 dB better, and the far-end crosstalk is 25dB better than conventional SiO2-coated TSVs at 2 GHz. Measurement results are also given. Good consistency can be seen, and can support the conclusion of the simulation results.
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低成本abf涂层tsv的低慢波效应和串扰
提出了一种减小sio2包覆硅孔(tsv)信号失真的解决方案。该机制可以用一个经过验证的四tsv系统等效电路模型来解释。基于该电路模型,可以观察到介电层厚度越大,慢波因子(SWF)越小,插入损耗越小,串扰电平越小。借助味之素积聚膜涂层(abf涂层)tsv,可以实现该解决方案。在2ghz时,与传统的二氧化硅涂层tsv相比,插入损耗提高了3db,近端串扰提高了5db,远端串扰提高了25dB。并给出了测量结果。可以看出较好的一致性,可以支持仿真结果的结论。
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Parasitic electrical and electromagnetic effects Heat management Passive electronic components Interconnection technology Reliability and maintainability
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