C. Kanamadi, B. Patil, N. Chougale, R. Patil, V. Sutar, N. Patil
{"title":"Effect of Sm Doping on Structural and Dielectric Properties of CoFe2O4 Ferrite","authors":"C. Kanamadi, B. Patil, N. Chougale, R. Patil, V. Sutar, N. Patil","doi":"10.21272/jnep.12(2).02026","DOIUrl":null,"url":null,"abstract":"Samarium doped cobalt ferrite, CoSmxFe2 – xO4 in which x varies as 0.0, 0.1, 0.3 and 0.5 were synthesized by conventional solid state reaction method. The impact of samarium doping on structural and dielectric properties is studied. The phase formation is confirmed by using XRD technique. The reflection peak broadening increases with increase in Sm concentration. The grain size is calculated by using scanning electron microscope image. The variation in dielectric constant () and dielectric loss (tan) as a function of frequency in the range 20 Hz to 1 MHz is studied. The dielectric constant is enhanced with increase in Sm concentration and decreases with increase in frequency.","PeriodicalId":16514,"journal":{"name":"Journal of Nano- and Electronic Physics","volume":"47 1","pages":"02026-1-02026-3"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nano- and Electronic Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21272/jnep.12(2).02026","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Samarium doped cobalt ferrite, CoSmxFe2 – xO4 in which x varies as 0.0, 0.1, 0.3 and 0.5 were synthesized by conventional solid state reaction method. The impact of samarium doping on structural and dielectric properties is studied. The phase formation is confirmed by using XRD technique. The reflection peak broadening increases with increase in Sm concentration. The grain size is calculated by using scanning electron microscope image. The variation in dielectric constant () and dielectric loss (tan) as a function of frequency in the range 20 Hz to 1 MHz is studied. The dielectric constant is enhanced with increase in Sm concentration and decreases with increase in frequency.
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