{"title":"Influence of Demetallization Processes on Capacitor Grade Polymer Films Breakdown Strength","authors":"V. Belko, O. Emelyanov, I. Ivanov, N. Fedotov","doi":"10.1109/ICD46958.2020.9341912","DOIUrl":null,"url":null,"abstract":"The influence of metallized polypropylene demetallization processes, such as an electric explosion of metal layer and metal evaporation due to surface arc discharge, was investigated. 6 $\\mu$ m thick polymer film with aluminum and zinc metallization were tested. It was found that electric explosion and surface arc impact on polymer surface cause 20 and 30 percent reduction of breakdown strength for aluminum metallization, and 14 and 21 percent for zinc metallization, respectively. The results are useful for choosing the parameters of MFC voltage overstressing regimes.","PeriodicalId":6795,"journal":{"name":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","volume":"37 1","pages":"166-168"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICD46958.2020.9341912","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The influence of metallized polypropylene demetallization processes, such as an electric explosion of metal layer and metal evaporation due to surface arc discharge, was investigated. 6 $\mu$ m thick polymer film with aluminum and zinc metallization were tested. It was found that electric explosion and surface arc impact on polymer surface cause 20 and 30 percent reduction of breakdown strength for aluminum metallization, and 14 and 21 percent for zinc metallization, respectively. The results are useful for choosing the parameters of MFC voltage overstressing regimes.
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