Effect of Grain Size on Pressure-Induced Tin Whisker Formation

T. Shibutani
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引用次数: 11

Abstract

This paper discusses the effect of grain size on pressure-induced tin whisker formation. Since a pressure has to overcome the increase in surface energy involved with tin whisker growth, a threshold stress for tin whisker growth exists. Based on traditional nucleation theory, the threshold stress is inversely proportional to the radius of the whisker. For the verification of the proposed theory, nanoindentation tests were carried out on three kinds of finishes with different grain sizes; tin-copper, bright tin, and matte tin. Whiskers and nodules were formed at the contact edge as the applied load increases up to the critical value related to grain size. The finite-element analysis revealed that high pressure concentrates near the contact edge on the tin-copper finish. The value of pressure to whisker formation is up to 40 MPa. This value agrees with the estimation from the proposed theory with a whisker radius of 0.1 μ m. Based on the proposed theory, the difference between whiskers and hillocks can be explained.
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晶粒尺寸对压力诱导锡晶须形成的影响
本文讨论了晶粒尺寸对压力诱导锡晶须形成的影响。由于压力必须克服与锡晶须生长有关的表面能的增加,因此存在锡晶须生长的阈值应力。基于传统的成核理论,阈值应力与晶须半径成反比。为验证上述理论,对3种不同晶粒尺寸的表面处理进行了纳米压痕试验;锡铜、光亮锡和哑光锡。当施加的载荷增加到与晶粒尺寸相关的临界值时,在接触边缘形成晶须和结核。有限元分析表明,高压集中在锡铜表面接触边缘附近。晶须形成的压力值可达40 MPa。该值与基于0.1 μ m的晶须半径理论的估计值一致。基于该理论,可以解释晶须与丘的区别。
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