Electric Fast Transient IEC 801-4. Susceptibility Of Electronic Equipment And Systems At Higher Frequencies And Voltages.

Abstract

This paper explains, how the burst "EFT' will be generated, what compromises have been madle to the standard 801-4 and the consequences of testing ielectronic equipment using these compromises. To avoid operational failure of some electronic equipment, the "real EFY must be simulated. In this paper the results of ElT testing on an electronic system will be presented. The test was conducted with spike frequencies up to 500k.H~ and voltage amplitudes higher than 4 kV.