Cadmium Telluride (CdTe) Compound and Silicon (Si) Semiconductor Materials Detectors for X-Ray

Hagag Gabasa, Assma Said, Karima Abdulla, Samah Aghtisa
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Abstract

There are different approaches and also materials to construct a detector for x-rays. the available semiconductor materials, Silicon (Si) is mainly used for charged particle detectors and soft X-ray detectors. Cadmium Telluride (CdTe) compound semiconductors for x-ray detectors have experienced a rather rapid development in the last few years, due to their appealing performance. In this paper we review the physical properties of semiconductor detectors for x-ray. In particular, we focus on compound semiconductor detectors. In addition, Si detector has better energy resolution achievement. However, it does not have good detection efficiency for higher energy above (40Kev). While CdTe detector supplies higher detection efficiency for x -rays about 100% for up to 100 keV in energy. The response functions of Si detector to reduce small x-ray, which has limited sensitivity for energy about 30keV. The XR-100T is high performance for x-ray and gamma ray detector by using 241Am (59.5keV), so the cooler are mounted the input FET a feedback components to the Amptek to charge sensitive preamplifier. Both the Si and CdTe detectors are connected to the PX2 combined amplifier and power supply, that was provide the voltage needed to operate XR-100T CdTe. The PX2 T CdTe amplifier has a Rise Time Discrimination circuit, measure the FWHM energy resolution of 55Fe (5.89) the peak in each spectrum hence a graph of energy resolution. Moreover, the Rise Time Discrimination So the escape peak of 55Fe was determined with Si detector was 11.66 keV, also k- sell x-ray energy was calculated to 5.77keV and the Rise Time Discrimination effect was studied on the spectrum when is it switched on and off. Its influence was found in decreasing the noise of the spectrum.
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碲化镉(CdTe)化合物和硅(Si)半导体材料x射线探测器
有不同的方法和材料来构建x射线探测器。现有的半导体材料中,硅(Si)主要用于带电粒子探测器和软x射线探测器。碲化镉(CdTe)化合物半导体由于其优异的性能,近年来在x射线探测器领域取得了长足的发展。本文综述了半导体x射线探测器的物理性质。我们特别关注化合物半导体探测器。此外,Si探测器具有较好的能量分辨效果。但对于(40Kev)以上的高能量,其检测效率不高。而CdTe探测器对x射线的探测效率更高,能量高达100 keV时,探测效率约为100%。硅探测器对减小小x射线的响应函数,其对能量约为30keV的灵敏度有限。XR-100T是高性能的x射线和伽马射线探测器,使用241Am (59.5keV),因此冷却器安装在输入场效应管和反馈元件到Amptek充电敏感前置放大器。Si和CdTe探测器都连接到PX2组合放大器和电源,提供运行XR-100T CdTe所需的电压。PX2 T CdTe放大器具有上升时间判别电路,测量频宽波能量分辨率为55Fe(5.89),各频谱中的峰值从而得到能量分辨率图。利用Si探测器测得55Fe的逸出峰为11.66 keV,计算出k- sell的x射线能量为5.77keV,并研究了打开和关闭k- sell时对光谱的上升时间分辨效应。在降低频谱噪声方面发现了它的影响。
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