E Bontempi , L Armelao , D Barreca , L Bertolo , G Bottaro , E Pierangelo , L.E Depero
{"title":"Structural characterization of sol-gel lanthanum cobaltite thin films","authors":"E Bontempi , L Armelao , D Barreca , L Bertolo , G Bottaro , E Pierangelo , L.E Depero","doi":"10.1016/S1463-0184(02)00040-0","DOIUrl":null,"url":null,"abstract":"<div><p>The present paper is focused on structural, microstructural and compositional studies on nanophasic LaCoO<sub>3</sub><span> thin films obtained by the sol-gel route. The sample structure and microstructure were investigated by Glancing Incidence X-Ray Diffraction (GIXRD) and X-Ray microdiffraction (MicroXRD), whereas the surface and in-depth chemical composition was studied by X-Ray Photoelectron Spectroscopy (XPS). All the films are structurally homogeneous and not textured. A cubic-to-rhomboedral phase transition was detected after the thermal treatment at 800 °C. Evidence of residual stress was found by GIXRD patterns collected at different incidence angles. After thermal annealing at 1000 °C, only the crystalline La</span><sub>2</sub>O<sub>3</sub> phase was detected.</p></div>","PeriodicalId":10766,"journal":{"name":"Crystal Engineering","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/S1463-0184(02)00040-0","citationCount":"23","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Crystal Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1463018402000400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23
Abstract
The present paper is focused on structural, microstructural and compositional studies on nanophasic LaCoO3 thin films obtained by the sol-gel route. The sample structure and microstructure were investigated by Glancing Incidence X-Ray Diffraction (GIXRD) and X-Ray microdiffraction (MicroXRD), whereas the surface and in-depth chemical composition was studied by X-Ray Photoelectron Spectroscopy (XPS). All the films are structurally homogeneous and not textured. A cubic-to-rhomboedral phase transition was detected after the thermal treatment at 800 °C. Evidence of residual stress was found by GIXRD patterns collected at different incidence angles. After thermal annealing at 1000 °C, only the crystalline La2O3 phase was detected.
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