The study on electro-physical properties of sandwich structures based on fullerite films

Proceedings KORUS 2000. The 4th Korea-Russia International Symposium On Science and Technology Pub Date : 2000-06-27 DOI:10.1109/KORUS.2000.866022

A. Berdinsky, Y. Shevtsov, Y.A. Saranchin, S. V. Trubin, Y. Shubin, B. Ayupov, D. Fink, L. T. Chadderton, J. Lee

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Abstract

We report on the technology of formation of sandwich structures based on fullerite films and on experimental results in research of optical and conductivity properties of these sandwich samples. Single crystals of sapphire (100) or silicon were used as substrates. The sandwich specimens were based on the structure M/C/sub 60//M (M=Cr, Pd, Ag, Al, Cu). The thickness of the fullerite films was /spl sim/0.2-1.0 /spl mu/m. The area of the C/sub 60/ film under the top contact was /spl sim/1 cm. The specimens have been investigated by infrared spectroscopy, spectrophotometry, ellipsometry and X-ray diffraction analysis. Measurements of the current/voltage characteristics and research on the temperature dependence of conductivity were performed as well. It was shown that metals such as Cr, Pd, Ag, Al, and Cu penetrate easily into the fullerite films. It appears that these specimens have a large conductivity. For silver/C/sub 60/ and other sandwich structures the conductivities show a semiconductor-like behaviour.

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富勒烯薄膜夹层结构的电物理性质研究

本文报道了基于富勒烯薄膜的三明治结构的形成技术，以及这些三明治样品的光学和电导率特性研究的实验结果。用蓝宝石(100)或硅的单晶作为衬底。夹层试样的结构为M/C/sub 60//M (M=Cr, Pd, Ag, Al, Cu)。富勒石薄膜厚度为/spl μ m/0.2 ~ 1.0 /spl μ m/ m。C/sub / 60/膜在顶部接触下的面积为/ sp1 sim/1 cm。用红外光谱法、分光光度法、椭偏仪和x射线衍射法对样品进行了分析。测量了电流/电压特性，并研究了电导率的温度依赖性。结果表明，Cr、Pd、Ag、Al、Cu等金属很容易渗透到富勒体薄膜中。由此可见，这些试样具有较大的电导率。对于银/C/sub - 60/和其他夹层结构，电导率表现出类似半导体的行为。

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Proceedings KORUS 2000. The 4th Korea-Russia International Symposium On Science and Technology

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