A 1-V PTAT current reference circuit with 0.05%/V current sensitivity to VDD

Jorge V. de la Cruz, A. Aita
{"title":"A 1-V PTAT current reference circuit with 0.05%/V current sensitivity to VDD","authors":"Jorge V. de la Cruz, A. Aita","doi":"10.1109/ISCAS.2016.7527287","DOIUrl":null,"url":null,"abstract":"This paper presents a CMOS PTAT current reference circuit which is robust against process and supply voltage variations over a wide voltage and temperature range, i.e. from 0.9 V to 2.5 V and from -40° C to 125° C, respectively. Two implementations of the same circuit were designed for comparison: the first one uses core transistors (1.1 V), while the second one employs IO transistors (2.5 V). The circuit uses a PMOS version of a conventional PTAT current generator with a PMOS self-cascode MOSFET and a PMOS feedback amplifier to enhance the circuit performance. Simulation results have shown a PTAT current sensitivity to the supply voltage of 2.9%/V @ 27° C (from 0.9 V to 1.5 V) and of 0.05%/V @ 27° C (from 1 V to 2.5 V) for core and IO transistors implementations, respectively, and a nearly constant current spread over temperature, with a maximum variation of 10% (3σ) for both ones.","PeriodicalId":6546,"journal":{"name":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","volume":"19 1","pages":"502-505"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Circuits and Systems (ISCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2016.7527287","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

This paper presents a CMOS PTAT current reference circuit which is robust against process and supply voltage variations over a wide voltage and temperature range, i.e. from 0.9 V to 2.5 V and from -40° C to 125° C, respectively. Two implementations of the same circuit were designed for comparison: the first one uses core transistors (1.1 V), while the second one employs IO transistors (2.5 V). The circuit uses a PMOS version of a conventional PTAT current generator with a PMOS self-cascode MOSFET and a PMOS feedback amplifier to enhance the circuit performance. Simulation results have shown a PTAT current sensitivity to the supply voltage of 2.9%/V @ 27° C (from 0.9 V to 1.5 V) and of 0.05%/V @ 27° C (from 1 V to 2.5 V) for core and IO transistors implementations, respectively, and a nearly constant current spread over temperature, with a maximum variation of 10% (3σ) for both ones.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
1-V PTAT电流基准电路,对VDD的电流灵敏度为0.05%/V
本文提出了一种CMOS PTAT电流参考电路,该电路在宽电压和温度范围内(即分别从0.9 V到2.5 V和从-40°C到125°C)对工艺和电源电压变化具有鲁棒性。为了进行比较,设计了同一电路的两种实现:第一种使用核心晶体管(1.1 V),而第二种使用IO晶体管(2.5 V)。该电路使用PMOS版本的传统PTAT电流发生器,带有PMOS自级联编码MOSFET和PMOS反馈放大器,以提高电路性能。仿真结果表明,对于核心和IO晶体管实现,PTAT电流对电源电压的灵敏度分别为2.9%/V @ 27°C(从0.9 V到1.5 V)和0.05%/V @ 27°C(从1 V到2.5 V),并且电流分布在温度上几乎恒定,两者的最大变化为10% (3σ)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Live demonstration: An automatic evaluation platform for physical unclonable function test Low-cost configurable ring oscillator PUF with improved uniqueness A passivity based stability measure for discrete 3-D IIR system realizations An effective generator-allocating method to enhance the robustness of power grid Global resource capacity algorithm with path splitting for virtual network embedding
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1