Uses of a new asymmetric loss-based process capability index in the electronic industries

Abstract

Abstract This article suggests a novel process capability index (PCI) termed as , which is based on an asymmetric loss function (linear exponential) for a normal process and offers a specific method of incorporating the loss in capability analysis. Next, we estimate the suggested PCI using the moment estimation approach when the process follows a normal distribution, and we compare the effectiveness of the investigated estimation methods in terms of their mean squared errors through simulation analysis. Additionally, the confidence intervals for the index are constructed using the generalized confidence interval (GCI) and parametric bootstrap confidence interval (BCI) approach. Using Monte Carlo simulation, the performance of the GCI and BCI is compared in terms of average width, associated coverage probabilities, and relative coverage. Finally, three real data sets from the electronic industries are re-analyzed to show the usefulness of the suggested index, MOM estimation, GCI and BCI.