Analysis of solder joint shape parameters on the stress and strain of the solder joint in the random vibration condition

Jianwei Hua, Chunyue Huang, Ying Liang, Tian-ming Li, Long Zhang
{"title":"Analysis of solder joint shape parameters on the stress and strain of the solder joint in the random vibration condition","authors":"Jianwei Hua, Chunyue Huang, Ying Liang, Tian-ming Li, Long Zhang","doi":"10.1109/ICEPT.2016.7583175","DOIUrl":null,"url":null,"abstract":"In this paper, the finite element model of optical interconnection module is established, and the finite element analysis of the model is carried out under the condition of random vibration loading based on ANSYS software. The distribution law of the stress and strain of the solder joint array is obtained. As an example, the stress and strain of the solder joint array with single factor variation of the shape parameters of the model were analyzed under the random vibration condition. The results show that the distribution of the stress and strain of the solder joint array is not uniform, and the change tendency of the stress and strain is presented by the inner layer of the solder joint to the outer solder joint. Among them, the maximum stress strain value of solder joints in the corner of the outer layer of the solder joints array region. With the increase of height of solder joint, solder joint array should strain showed a tendency to increase, along with increase of the volume of solder joint, solder joint array should stress and strain values decrease gradually, with pad diameter increases, the solder joint array should stress and strain value increases.","PeriodicalId":6881,"journal":{"name":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","volume":"16 4 1","pages":"455-460"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2016.7583175","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

In this paper, the finite element model of optical interconnection module is established, and the finite element analysis of the model is carried out under the condition of random vibration loading based on ANSYS software. The distribution law of the stress and strain of the solder joint array is obtained. As an example, the stress and strain of the solder joint array with single factor variation of the shape parameters of the model were analyzed under the random vibration condition. The results show that the distribution of the stress and strain of the solder joint array is not uniform, and the change tendency of the stress and strain is presented by the inner layer of the solder joint to the outer solder joint. Among them, the maximum stress strain value of solder joints in the corner of the outer layer of the solder joints array region. With the increase of height of solder joint, solder joint array should strain showed a tendency to increase, along with increase of the volume of solder joint, solder joint array should stress and strain values decrease gradually, with pad diameter increases, the solder joint array should stress and strain value increases.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
分析了随机振动条件下焊点形状参数对焊点应力应变的影响
本文建立了光互联模块的有限元模型,并基于ANSYS软件对该模型在随机振动载荷条件下进行了有限元分析。得到了焊点阵列的应力应变分布规律。以随机振动为例,分析了模型形状参数单因素变化情况下的焊点阵列的应力和应变。结果表明:焊点阵列的应力应变分布并不均匀,应力应变的变化趋势呈现由焊点内层向外层扩散的趋势;其中,焊点的最大应力应变值位于焊点阵列区域的外层角部。随着焊点高度的增加,焊点阵列应应力应变呈增大趋势,随着焊点体积的增大,焊点阵列应应力应变值逐渐减小,随着焊盘直径的增大,焊点阵列应应力应变值逐渐增大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Unlocking the full potential of Lithography for Advanced Packaging A compact QCW conduction-cooled high power semiconductor laser array Thermal behavior of microchannel cooled high power diode laser arrays Analysis of photoluminescence mechanisms and thermal quenching effects for multicolor phosphor films used in high color rendering white LEDs Interfacial reaction and IMC growth between the undercooled liquid lead-free solder and Cu metallization
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1