基于伪标签机器学习的继电器预测维护算法

IF 5.2 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Open Journal of the Industrial Electronics Society Pub Date : 2023-10-13 DOI:10.1109/OJIES.2023.3323870
Fabian Winkel;Oliver Wallscheid;Peter Scholz;Joachim Böcker
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引用次数: 0

摘要

预测性维护(PdM)已经成为一个重要的工业特征。现有的方法主要集中在剩余使用寿命(RUL)回归或异常检测来实现给定应用程序的PdM。这些方法假设在系统生命周期结束时,单调的退化过程会导致单一的灾难性故障。相比之下,在实际应用中可以找到更复杂的降解过程,其特点是自我修复或非灾难性异常。具有复杂退化的器件的一个重要例子是机电继电器。由于现有的PdM解决方案在应用于实际继电器退化数据集时失败,因此提出了未标记数据(MAUD)维护算法,以检测磨损迹象并及时启用服务。具体来说,MAUD是基于人工神经网络(ANN),该网络是半监督训练的。对546个继电器的测量数据进行的实验表明,MAUD优于各种现有方法:静态B10阈值(代表继电器维护的最新状态)的利用率提高了17.07 p.p.,而故障率降低了6.42 p.p.。基于机器学习的方法,如RUL估计和异常检测,在保持相同故障率的情况下,与MAUD相比,利用率低得多(高达31.83 p.p.)。
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Pseudolabeling Machine Learning Algorithm for Predictive Maintenance of Relays
Predictive maintenance (PdM) has become an important industrial feature. Existing methods mainly focus on remaining useful life (RUL) regression or anomaly detection to achieve PdM in a given application. Those approaches assume monotonic degradation processes leading to a single catastrophic failure at the system's end of lifetime. In contrast, much more complex degradation processes can be found in real-world applications, which are characterized by effects like self-healing or noncatastrophic anomalies. A important example of devices with complex degradation are electromechanical relays. As established PdM solutions failed when applied to a real-world relays degradation data set, the maintenance algorithm for unlabeled data (MAUD) is presented to detect signs of wear and enable a service in time. In detail, MAUD is based on an artificial neural network (ANN), which is trained semisupervised. Experiments with measurement data from 546 relays show that MAUD is superior to various existing methods: The static B10 threshold, which represents the state of the art in relay maintenance, is surpassed by a 17.07 p.p. increase in utilization while reducing failures by 6.42 p.p. Methods based on machine learning, such as RUL estimation and anomaly detection, achieved much lower utilization (up to 31.83 p.p.) compared with MAUD while maintaining the same failure rate.
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来源期刊
IEEE Open Journal of the Industrial Electronics Society
IEEE Open Journal of the Industrial Electronics Society ENGINEERING, ELECTRICAL & ELECTRONIC-
CiteScore
10.80
自引率
2.40%
发文量
33
审稿时长
12 weeks
期刊介绍: The IEEE Open Journal of the Industrial Electronics Society is dedicated to advancing information-intensive, knowledge-based automation, and digitalization, aiming to enhance various industrial and infrastructural ecosystems including energy, mobility, health, and home/building infrastructure. Encompassing a range of techniques leveraging data and information acquisition, analysis, manipulation, and distribution, the journal strives to achieve greater flexibility, efficiency, effectiveness, reliability, and security within digitalized and networked environments. Our scope provides a platform for discourse and dissemination of the latest developments in numerous research and innovation areas. These include electrical components and systems, smart grids, industrial cyber-physical systems, motion control, robotics and mechatronics, sensors and actuators, factory and building communication and automation, industrial digitalization, flexible and reconfigurable manufacturing, assistant systems, industrial applications of artificial intelligence and data science, as well as the implementation of machine learning, artificial neural networks, and fuzzy logic. Additionally, we explore human factors in digitalized and networked ecosystems. Join us in exploring and shaping the future of industrial electronics and digitalization.
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