Single Crystal Growth of Aluminum substituted Strontium Hexaferrite SrFe12-xAlxO19

The paper presents the results of testing the technique for obtaining Al-substituted strontium hexaferrite SrFe 12-x Al x O 19 by spontaneous crystallization method. Using the scanning electron microscope JEOL JSM7001F equipped with an energy dispersive X-ray fluorescence analyzer INCA X-max 80 (Oxford Instruments), the chemical composition of the samples was established: for SrFe 12 O 19 – 61,54%O, 35,53%Fe, 2,93%Sr; for SrFe 12-0,67 Al 0,67 O 19 – 61,99%O, 33,27%Fe, 2,76%Sr, 1,98%Al.  A uniform distribution of iron, strontium and aluminum ions was detected. It was found that the samples obtained are monophasic. The crystal structure was studied by X-ray phase analysis using a Rigaku Ultima IV diffractometer. The crystal lattice parameters of the obtained sample are calculated for SrFe 12-x Al x O 19 : a – 5,8792(8) A; c – 23,011(3) A; V – 688,83(13) A 3 . The Curie temperatures were determined by differential scanning calorimetry: for SrFe 12 O 19 – 450°С; for SrFe 12-0,67 Al 0,67 O 19 – 435°С on the Netzsch 449C Jupiter.