Bi对Sn-3Ag-0.5Cu/Cu焊点金属间化合物生长动力学的影响

Jie Zhao, Linge Qi, Lai Wang
{"title":"Bi对Sn-3Ag-0.5Cu/Cu焊点金属间化合物生长动力学的影响","authors":"Jie Zhao, Linge Qi, Lai Wang","doi":"10.1109/HDP.2006.1707598","DOIUrl":null,"url":null,"abstract":"Three lead-free solder alloys, Sn-3Ag-0.5Cu, Sn-3Ag-0.5Cu-1Bi and Sn-3Ag-0.5Cu-3Bi, were used in the current experiments to investigated the microstructural evolution as well as the kinetics of intermetallic compound (IMC) layer growth. The experimental results indicated that the thickness of Cu6Sn5 intermetallic layer at the solder/Cu interface increases with aging temperature, while the growth rate of IMC in Sn-3Ag-0.5Cu-3Bi/Cu joints is slower than that in Sn-3Ag-0.5Cu-1Bi/Cu joints and Sn-Ag-Cu solder joints. The effect of Bi element is attributed to the accumulation of Bi near the joint and the enhancement of the activation energy by the addition of Bi","PeriodicalId":406794,"journal":{"name":"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Effect of Bi on the kinetics of intermetallics growth in Sn-3Ag-0.5Cu/Cu solder joint\",\"authors\":\"Jie Zhao, Linge Qi, Lai Wang\",\"doi\":\"10.1109/HDP.2006.1707598\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Three lead-free solder alloys, Sn-3Ag-0.5Cu, Sn-3Ag-0.5Cu-1Bi and Sn-3Ag-0.5Cu-3Bi, were used in the current experiments to investigated the microstructural evolution as well as the kinetics of intermetallic compound (IMC) layer growth. The experimental results indicated that the thickness of Cu6Sn5 intermetallic layer at the solder/Cu interface increases with aging temperature, while the growth rate of IMC in Sn-3Ag-0.5Cu-3Bi/Cu joints is slower than that in Sn-3Ag-0.5Cu-1Bi/Cu joints and Sn-Ag-Cu solder joints. The effect of Bi element is attributed to the accumulation of Bi near the joint and the enhancement of the activation energy by the addition of Bi\",\"PeriodicalId\":406794,\"journal\":{\"name\":\"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HDP.2006.1707598\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HDP.2006.1707598","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

本实验采用Sn-3Ag-0.5Cu、Sn-3Ag-0.5Cu- 1bi和Sn-3Ag-0.5Cu- 3bi三种无铅钎料合金,研究了钎料的显微组织演变和金属间化合物(IMC)层生长动力学。实验结果表明,随着时效温度的升高,钎料/Cu界面处的Cu6Sn5金属间层厚度增加,而Sn-3Ag-0.5Cu-3Bi/Cu钎料中IMC的增长速度要慢于Sn-3Ag-0.5Cu-1Bi/Cu钎料和Sn-Ag-Cu钎料。Bi元素的作用主要是由于Bi元素在接头附近的富集和Bi元素的加入提高了活化能
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Effect of Bi on the kinetics of intermetallics growth in Sn-3Ag-0.5Cu/Cu solder joint
Three lead-free solder alloys, Sn-3Ag-0.5Cu, Sn-3Ag-0.5Cu-1Bi and Sn-3Ag-0.5Cu-3Bi, were used in the current experiments to investigated the microstructural evolution as well as the kinetics of intermetallic compound (IMC) layer growth. The experimental results indicated that the thickness of Cu6Sn5 intermetallic layer at the solder/Cu interface increases with aging temperature, while the growth rate of IMC in Sn-3Ag-0.5Cu-3Bi/Cu joints is slower than that in Sn-3Ag-0.5Cu-1Bi/Cu joints and Sn-Ag-Cu solder joints. The effect of Bi element is attributed to the accumulation of Bi near the joint and the enhancement of the activation energy by the addition of Bi
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Nanopackaging: nanotechnologies and electronics packaging Simulation design of capacitive Frisch grid CdZnTe detectors Curvature-compensated CMOS bandgap reference with 1.8-V operation Effect of Bi on the kinetics of intermetallics growth in Sn-3Ag-0.5Cu/Cu solder joint High-speed board-to-board interconnects utilizing flexible foils and elastomeric connectors
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1