{"title":"考虑V/sub / dd/和V/sub / th/作为设计自由度的功率最优中继器插入","authors":"Yu Ching Chang, King Ho Tarn, Lei He","doi":"10.1109/LPE.2005.195503","DOIUrl":null,"url":null,"abstract":"This work first presents an analytical repeater insertion method which optimizes power under delay constraint for a single net. This method finds the optimal repeater insertion lengths, repeater sizes, and V/sub dd/ and V/sub th/ levels for a net with a delay target, and it reduces more than 50% power over a previous work which does not consider V/sub dd/ and V/sub th/ optimization. This work further presents the power saving when multiple V/sub dd/ and V/sub th/ levels are used in repeater insertion at the full-chip level. Compared to the case with single V/sub dd/ and V/sub th/ suggested by ITRS, optimized dual V/sub dd/ and dual V/sub th/ reduce overall global interconnect power by 47%, 28% and 13% for 130nm, 90nm and 65nm technology nodes, respectively, but extra V/sub dd/ or V/sub th/ levels only give marginal improvement. We also show that an optimized single V/sub th/ reduce interconnect power almost as effective as dual-V/sub th/ does, in contrast to the need of dual V/sub th/ for logic circuits.","PeriodicalId":256018,"journal":{"name":"ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005.","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Power-optimal repeater insertion considering V/sub dd/ and V/sub th/ as design freedoms\",\"authors\":\"Yu Ching Chang, King Ho Tarn, Lei He\",\"doi\":\"10.1109/LPE.2005.195503\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work first presents an analytical repeater insertion method which optimizes power under delay constraint for a single net. This method finds the optimal repeater insertion lengths, repeater sizes, and V/sub dd/ and V/sub th/ levels for a net with a delay target, and it reduces more than 50% power over a previous work which does not consider V/sub dd/ and V/sub th/ optimization. This work further presents the power saving when multiple V/sub dd/ and V/sub th/ levels are used in repeater insertion at the full-chip level. Compared to the case with single V/sub dd/ and V/sub th/ suggested by ITRS, optimized dual V/sub dd/ and dual V/sub th/ reduce overall global interconnect power by 47%, 28% and 13% for 130nm, 90nm and 65nm technology nodes, respectively, but extra V/sub dd/ or V/sub th/ levels only give marginal improvement. We also show that an optimized single V/sub th/ reduce interconnect power almost as effective as dual-V/sub th/ does, in contrast to the need of dual V/sub th/ for logic circuits.\",\"PeriodicalId\":256018,\"journal\":{\"name\":\"ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005.\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LPE.2005.195503\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISLPED '05. Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LPE.2005.195503","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power-optimal repeater insertion considering V/sub dd/ and V/sub th/ as design freedoms
This work first presents an analytical repeater insertion method which optimizes power under delay constraint for a single net. This method finds the optimal repeater insertion lengths, repeater sizes, and V/sub dd/ and V/sub th/ levels for a net with a delay target, and it reduces more than 50% power over a previous work which does not consider V/sub dd/ and V/sub th/ optimization. This work further presents the power saving when multiple V/sub dd/ and V/sub th/ levels are used in repeater insertion at the full-chip level. Compared to the case with single V/sub dd/ and V/sub th/ suggested by ITRS, optimized dual V/sub dd/ and dual V/sub th/ reduce overall global interconnect power by 47%, 28% and 13% for 130nm, 90nm and 65nm technology nodes, respectively, but extra V/sub dd/ or V/sub th/ levels only give marginal improvement. We also show that an optimized single V/sub th/ reduce interconnect power almost as effective as dual-V/sub th/ does, in contrast to the need of dual V/sub th/ for logic circuits.