{"title":"基于近场数据的反射面粗糙度评估","authors":"G. Cheng, Yong Zhu, J. Grzesik, C. S. Lee","doi":"10.1109/IWMN.2017.8078386","DOIUrl":null,"url":null,"abstract":"A novel technique based on the Field Mapping Algorithm (FMA) is proposed to gauge reflector surface smoothness from near-field reflector measurements. The proposed method provides exact information of the antenna surface with much less computation time compared with other available techniques. A few examples are given to illustrate the advantages of the new surface-analysis technique.","PeriodicalId":201479,"journal":{"name":"2017 IEEE International Workshop on Measurement and Networking (M&N)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Roughness assessment of reflector surface via near-field data\",\"authors\":\"G. Cheng, Yong Zhu, J. Grzesik, C. S. Lee\",\"doi\":\"10.1109/IWMN.2017.8078386\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel technique based on the Field Mapping Algorithm (FMA) is proposed to gauge reflector surface smoothness from near-field reflector measurements. The proposed method provides exact information of the antenna surface with much less computation time compared with other available techniques. A few examples are given to illustrate the advantages of the new surface-analysis technique.\",\"PeriodicalId\":201479,\"journal\":{\"name\":\"2017 IEEE International Workshop on Measurement and Networking (M&N)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE International Workshop on Measurement and Networking (M&N)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWMN.2017.8078386\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE International Workshop on Measurement and Networking (M&N)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWMN.2017.8078386","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Roughness assessment of reflector surface via near-field data
A novel technique based on the Field Mapping Algorithm (FMA) is proposed to gauge reflector surface smoothness from near-field reflector measurements. The proposed method provides exact information of the antenna surface with much less computation time compared with other available techniques. A few examples are given to illustrate the advantages of the new surface-analysis technique.
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