{"title":"四探针法二氧化锡薄膜片阻测量装置的建立","authors":"Rikesh Bhattarai, S. Shrestha","doi":"10.11648/J.AJPA.20170505.11","DOIUrl":null,"url":null,"abstract":"The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.","PeriodicalId":329149,"journal":{"name":"American Journal of Physics and Applications","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-08-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method\",\"authors\":\"Rikesh Bhattarai, S. Shrestha\",\"doi\":\"10.11648/J.AJPA.20170505.11\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.\",\"PeriodicalId\":329149,\"journal\":{\"name\":\"American Journal of Physics and Applications\",\"volume\":\"99 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-08-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"American Journal of Physics and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.11648/J.AJPA.20170505.11\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"American Journal of Physics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11648/J.AJPA.20170505.11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method
The main purpose of the paper is to construct the four probes to calculate the sheet resistance the thin film. For the thin film this paper presents the experimental preparation of Tin dioxide thin films. A dual voltage power supply and constant current source is developed to study deeply for the constant current output. Electrical properties are measured using constant current source, sheet resistance, four probe), digital multimeter and micro ammeter. The effect of thickness of sheet resistance thin film is carried out by four probe method.