多运行内存测试的地址序列生成

6th International Conference on Computer Information Systems and Industrial Management Applications (CISIM'07) Pub Date : 2007-06-28 DOI:10.1109/CISIM.2007.9

S. Yarmolik, I. Mrozek, B. Sokol

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引用次数: 2

摘要

本文讨论了多运行内存测试的地址生成问题。介绍了地址序列生成算法，提出了一种新的地址序列生成方法。最后给出了该地址序列的实验结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Address Sequences Generation for Multiple Run Memory Testing

This paper deals with address generation for multiple run memory tests. It presents the algorithms for address sequences generation and proposes the new method for address sequences generation. The experimental results with the proposed address sequence are also shown.

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6th International Conference on Computer Information Systems and Industrial Management Applications (CISIM'07)

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