Seungsik Lee, B. Park, Seunghyun Jang, Sangsung Choi
{"title":"UWB通信中T/RX开关性能的比较","authors":"Seungsik Lee, B. Park, Seunghyun Jang, Sangsung Choi","doi":"10.1109/ICACT.2008.4493795","DOIUrl":null,"url":null,"abstract":"This paper compares performance of three transmitter/receiver (T/RX) switch structures, which can be included as UWB RF transceiver. They are designed using complementary metal-oxide semiconductor (CMOS) 0.13 um technology and simulated each structure. They can be operated from 3 to 5 GHz and package model are applied for chip on board(COB) test. They have 1.8 dB insertion loss and more than 30 dB isolation at 5 GHz.","PeriodicalId":448615,"journal":{"name":"2008 10th International Conference on Advanced Communication Technology","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Comparison of T/RX Switch Performance for UWB Communication\",\"authors\":\"Seungsik Lee, B. Park, Seunghyun Jang, Sangsung Choi\",\"doi\":\"10.1109/ICACT.2008.4493795\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper compares performance of three transmitter/receiver (T/RX) switch structures, which can be included as UWB RF transceiver. They are designed using complementary metal-oxide semiconductor (CMOS) 0.13 um technology and simulated each structure. They can be operated from 3 to 5 GHz and package model are applied for chip on board(COB) test. They have 1.8 dB insertion loss and more than 30 dB isolation at 5 GHz.\",\"PeriodicalId\":448615,\"journal\":{\"name\":\"2008 10th International Conference on Advanced Communication Technology\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-04-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 10th International Conference on Advanced Communication Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICACT.2008.4493795\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 10th International Conference on Advanced Communication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICACT.2008.4493795","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Comparison of T/RX Switch Performance for UWB Communication
This paper compares performance of three transmitter/receiver (T/RX) switch structures, which can be included as UWB RF transceiver. They are designed using complementary metal-oxide semiconductor (CMOS) 0.13 um technology and simulated each structure. They can be operated from 3 to 5 GHz and package model are applied for chip on board(COB) test. They have 1.8 dB insertion loss and more than 30 dB isolation at 5 GHz.