{"title":"可靠性评估和预测方法的改进","authors":"B. Johnson, L. Gullo","doi":"10.1109/RAMS.2000.816304","DOIUrl":null,"url":null,"abstract":"This paper describes the continuing evolution of Honeywell's HIRAP, Honeywell In-Service Reliability Assessment Program. The approaches used in HIRAP remain consistent with industry efforts in the area of reliability assessment. The paper also presents a description of the process flows, showing simplifications that have occurred in the process over the last year. Unlike conventional reliability prediction methodologies, which focus solely on part failure rates, the methodologies presented here incorporate design failure rates, manufacturing process failure rates and other causes for equipment removal.","PeriodicalId":178321,"journal":{"name":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"Improvements in reliability assessment and prediction methodology\",\"authors\":\"B. Johnson, L. Gullo\",\"doi\":\"10.1109/RAMS.2000.816304\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the continuing evolution of Honeywell's HIRAP, Honeywell In-Service Reliability Assessment Program. The approaches used in HIRAP remain consistent with industry efforts in the area of reliability assessment. The paper also presents a description of the process flows, showing simplifications that have occurred in the process over the last year. Unlike conventional reliability prediction methodologies, which focus solely on part failure rates, the methodologies presented here incorporate design failure rates, manufacturing process failure rates and other causes for equipment removal.\",\"PeriodicalId\":178321,\"journal\":{\"name\":\"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-01-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.2000.816304\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 2000 Proceedings. International Symposium on Product Quality and Integrity (Cat. No.00CH37055)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2000.816304","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improvements in reliability assessment and prediction methodology
This paper describes the continuing evolution of Honeywell's HIRAP, Honeywell In-Service Reliability Assessment Program. The approaches used in HIRAP remain consistent with industry efforts in the area of reliability assessment. The paper also presents a description of the process flows, showing simplifications that have occurred in the process over the last year. Unlike conventional reliability prediction methodologies, which focus solely on part failure rates, the methodologies presented here incorporate design failure rates, manufacturing process failure rates and other causes for equipment removal.