测定植被叶片复介电常数的新方法

1992 22nd European Microwave Conference Pub Date : 1992-10-01 DOI:10.1109/EUMA.1992.335873

S. Trabelsi, M. Ghomi, J. Peuch, H. Baudrand

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引用次数: 1

摘要

提出了一种新的植被叶片x波段模拟方法。这里，以玉米叶为例，假定它是一个圆柱形电介质柱和一个非常薄的电介质片的叠加。我们通过模拟模型从测量的s参数确定复介电常数。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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New Approach for Determining the Complex Dielectric Constant of Vegetation Leaves

A new approach for modeling the vegetation leaves in the X-band is presented. Here, as an example a corn leaf is considered, where it is assumed to be a superposition of a cylindrical dielectric post and a very thin dielectric sheet. We determine the complex dielectric constant by a simulation model from measured S-parameters.

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1992 22nd European Microwave Conference

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