双栅PNM-IGBT高速开关的注入控制技术

M. Sumitomo, H. Sakane, K. Arakawa, Y. Higuchi, M. Matsui
{"title":"双栅PNM-IGBT高速开关的注入控制技术","authors":"M. Sumitomo, H. Sakane, K. Arakawa, Y. Higuchi, M. Matsui","doi":"10.1109/ISPSD.2013.6694392","DOIUrl":null,"url":null,"abstract":"We proposed a PNM-IGBT [1] that can realize performance close to the theoretical limit shown by Nakagawa, et, al [2, 3]. In that work, we confirmed PNM-IGBT can achieve a very low saturation voltage due to its great injection enhancement effect. However, it is accompanied by a slight increase in turn-off-loss. We believe that we can diminish this increase by our unique control technique. Therefore, in this paper, we propose a fundamentally new IGBT control technique. By combining this control technique and PNM-IGBT, it becomes possible to achieve both a low saturation voltage and fast switching speed. To demonstrate the above hypothesis, we have developed a double gate PNM-IGBT, and confirmed a decrease in turn-off-loss of 30% using this technique.","PeriodicalId":175520,"journal":{"name":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":"{\"title\":\"Injection control technique for high speed switching with a double gate PNM-IGBT\",\"authors\":\"M. Sumitomo, H. Sakane, K. Arakawa, Y. Higuchi, M. Matsui\",\"doi\":\"10.1109/ISPSD.2013.6694392\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We proposed a PNM-IGBT [1] that can realize performance close to the theoretical limit shown by Nakagawa, et, al [2, 3]. In that work, we confirmed PNM-IGBT can achieve a very low saturation voltage due to its great injection enhancement effect. However, it is accompanied by a slight increase in turn-off-loss. We believe that we can diminish this increase by our unique control technique. Therefore, in this paper, we propose a fundamentally new IGBT control technique. By combining this control technique and PNM-IGBT, it becomes possible to achieve both a low saturation voltage and fast switching speed. To demonstrate the above hypothesis, we have developed a double gate PNM-IGBT, and confirmed a decrease in turn-off-loss of 30% using this technique.\",\"PeriodicalId\":175520,\"journal\":{\"name\":\"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)\",\"volume\":\"97 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"42\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.2013.6694392\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2013.6694392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 42

摘要

我们提出了一种PNM-IGBT[1],可以实现接近Nakagawa等人[2,3]的理论极限的性能。在这项工作中,我们证实了PNM-IGBT由于其强大的注入增强效果可以实现非常低的饱和电压。然而,它伴随着关闭损失的轻微增加。我们相信我们可以通过我们独特的控制技术来减少这种增长。因此,本文提出了一种全新的IGBT控制技术。通过将该控制技术与PNM-IGBT相结合,可以实现低饱和电压和快速开关速度。为了证明上述假设,我们开发了一种双栅极PNM-IGBT,并证实使用这种技术可以减少30%的关断损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Injection control technique for high speed switching with a double gate PNM-IGBT
We proposed a PNM-IGBT [1] that can realize performance close to the theoretical limit shown by Nakagawa, et, al [2, 3]. In that work, we confirmed PNM-IGBT can achieve a very low saturation voltage due to its great injection enhancement effect. However, it is accompanied by a slight increase in turn-off-loss. We believe that we can diminish this increase by our unique control technique. Therefore, in this paper, we propose a fundamentally new IGBT control technique. By combining this control technique and PNM-IGBT, it becomes possible to achieve both a low saturation voltage and fast switching speed. To demonstrate the above hypothesis, we have developed a double gate PNM-IGBT, and confirmed a decrease in turn-off-loss of 30% using this technique.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
JFET pinched bootstrap diode (JPBD) without substrate leakage current integration to 120V BCDMOS process Comparison of theoretical limits between superjunction and field plate structures A segmented gate driver IC for the reduction of IGBT collector current over-shoot at turn-on HB1340 ℄ Advanced 0.13um BCDMOS technology of complimentary LDMOS including fully isolated transistors Injection control technique for high speed switching with a double gate PNM-IGBT
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1