{"title":"工业设计中的扫描压缩实现-案例研究","authors":"D. Hsu, R. Press","doi":"10.1109/ATS.2009.89","DOIUrl":null,"url":null,"abstract":"Embedded scan test compression is used to enable high test quality and has become a standard practice on many designs. This paper describes power and timing experiences related to embedded compression technology. A commercial tool was used to implement EDT compression technology in three wireless designs. The case study and results demonstrate the effect of power reduction methods and timing closure considerations.","PeriodicalId":106283,"journal":{"name":"2009 Asian Test Symposium","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Scan Compression Implementation in Industrial Design - Case Study\",\"authors\":\"D. Hsu, R. Press\",\"doi\":\"10.1109/ATS.2009.89\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Embedded scan test compression is used to enable high test quality and has become a standard practice on many designs. This paper describes power and timing experiences related to embedded compression technology. A commercial tool was used to implement EDT compression technology in three wireless designs. The case study and results demonstrate the effect of power reduction methods and timing closure considerations.\",\"PeriodicalId\":106283,\"journal\":{\"name\":\"2009 Asian Test Symposium\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Asian Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2009.89\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2009.89","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Scan Compression Implementation in Industrial Design - Case Study
Embedded scan test compression is used to enable high test quality and has become a standard practice on many designs. This paper describes power and timing experiences related to embedded compression technology. A commercial tool was used to implement EDT compression technology in three wireless designs. The case study and results demonstrate the effect of power reduction methods and timing closure considerations.
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